System and apparatus for measurement of light scattering from a sample
US9459206B2 · kind B2 · utility
1Cited by
6References
17Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | May 1, 2013 |
| Grant date | Oct 4, 2016 |
| Priority date | — |
| Expiry date | Sep 20, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/57
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus and method for providing a solution that enables technicians or other technical professionals to obtain accurate gloss, haze and DOI values for a reflecting sample due to the surface conditions of the sample. The apparatus and method allow for the generation of a data model of the surface of a sample using a sensor array designed to detect the divergence of a collimated beam of light reflected off the surface of the sample. The same principle enables technical professionals to obtain accurate haze and clarity values for a transparent or translucent sample that is trans-illuminated by light.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.