Patent · US Active

Method for detecting electromagnetic property of oriented silicon steel

US9460054B2 · kind B2 · utility

0Cited by

1References

1Claims

0Family size

Assignee

BAOSHAN IRON & STEEL CO., LTD. · CN

Inventors

Meihong Wu · Shanghai, CN
Weizhong Jin · Shanghai, CN
Huande Sun · Shanghai, CN
Guohua Yang · San Jose, US
Kanyi Shen · Shanghai, CN
Jie Huang · Shanghai, CN
Guobao Li · Shanghai, CN

Key dates

Filing date	Apr 12, 2011
Grant date	Oct 4, 2016
Priority date	—
Expiry date	Sep 30, 2032

Classification

Technology area (CPC G)Physics
CPC primaryG01R33/0064
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method for detecting electromagnetic property of oriented silicon steel, the method comprises: measuring Euler angles of each of crystal grains in a specimen by use of metallographic etch-pit method; calculating orientation deviation angle θi (degree) of the crystal grain; combining area Si (mm2) of the crystal grain and correction coefficient X of element Si (X=0.1˜10 T/degree); correcting on the basis of the magnetic property B0 (saturation magnetic induction, T) of single-crystal material by using these parameters (θi, Si, X), formula for correcting is

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.