Method and reference model for checking a measuring system
US9462993B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 28, 2013 |
| Grant date | Oct 11, 2016 |
| Priority date | — |
| Expiry date | Mar 30, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG09B23/283
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
The invention relates to a reference object (3) and a method for checking a measuring system (1), wherein a plurality of three-dimensional recordings (4, 8) of a reference object are recorded from different recording directions (5) by means of the measuring system (1). The reference object (3) has a closed shape, wherein each of the three-dimensional recordings (4) is registered with at least the preceding recording (4). In the case of a faulty calibration and/or in the case of a faulty registration, the individual recordings (4, 8) are deformed compared to the actual shape of the reference object (3), so that the deformation continues when assembling the individual three-dimensional recordings (4) to form an overall recording (54) and the generated overall recording (54) deviates in its dimensions from the dimensions of the reference object (3) as a result thereof. At least one object region (10) of the reference object (3) is measured twice, at the beginning of a circuit and at the end of the circuit, wherein a distance (55) is determined in the overall recording (54) between a first position of the object region (10) in a first recording at the beginning of the circuit and a sec…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.