Test system and method for testing high-voltage technology

US9465085B2 · kind B2 · utility

Assignee

• MASCHINENFABRIK REINHAUSEN GMBH · DE

Inventors

• Martin Hinow · Dresden, DE
• Uwe Stephan · Freital, DE
• Guenther Siebert · Dresden, DE
• Ralf Bergmann · Dresden, DE
• Andreas Thiede · Dittelbrunn, DE

Key dates

• Filing date: Jan 15, 2013
• Grant date: Oct 11, 2016
• Expiry date: Mar 7, 2033

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R31/72
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

The present invention relates to a test system for high-voltage technology devices, in particular shunt reactors, as defined in the preamble of independent patent claim 1. The invention also relates to a method which can be carried out with this test system and is intended to test high-voltage technology devices according to coordinate patent claim 5. The general idea of the test system according to the invention is to provide a continuously adjustable inductance and a capacitance, which can be adjusted in discrete steps, on the secondary side of the test transformer in such a manner that said components form a series resonant circuit together with the test object in the form of an inductance. In the method which can be carried out with the test system according to the invention, a rough adjustment of the test system is carried out using the discretely adjustable capacitances of the capacitor bank by connecting individual capacitances of the capacitor bank via an iterative process if an undercapacitance is measured in the test system by means of a measuring device or by disconnecting individual capacitances if an overcapacitance is measured by means of the measuring device until a …