Dynamic adjustment of operational parameters to compensate for sensor based measurements of circuit degradation

US9465373B2 · kind B2 · utility

Assignee

• International Business Machines Corporation · US

Inventors

• Malcolm S. Allen-Ware · Tucson, US
• Alan J. Drake · Round Rock, US
• Michael Stephen Floyd · Cedar Park, US
• Tilman Gloekler · Schrobenhausen, DE
• Charles R. Lefurgy · Austin, US
• Karthick Rajamani · Austin, US

Key dates

• Filing date: Sep 17, 2013
• Grant date: Oct 11, 2016
• Expiry date: Oct 13, 2034

Classification

• Technology area (CPC G): Physics
• CPC primary: G06F11/008
• WIPO field: Control
• WIPO sector: Instruments

Abstract

A mechanism is provided for implementing an operational parameter change within the data processing system based on an identified degradation. One or more degradations existing in the data processing system are identified based on a set of degradation values obtained from a set of degradation sensors. A determination is made as to whether one or more operational parameters need to be modified based on the one or more identified degradations. Responsive to determining that the one or more operational parameters need to be modified based on the one or more identified degradations, an input change is implemented to a one or more control devices in order that the one or more operational parameters are modified.