Patent · US Active

Measuring system having electromechanical resonators, method for manufacturing such a system, and method for reading at least two electromechanical resonators

US9470576B2 · kind B2 · utility

1Cited by
5References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 29, 2012
Grant dateOct 18, 2016
Priority date
Expiry dateMar 29, 2033

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01D5/14
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A measuring system including: at least two electromechanical resonators each having a resonant frequency varying around an offload resonant frequency according to a physical quantity to be measured; at least one reading device connected to inputs of the resonators and configured to supply an excitation signal on the inputs; and a memory in which is recorded, for each resonator, offload resonance information relating to the offload resonant frequency of the resonator. Each reading device is configured to determine the resonant frequency of one or more resonators selected for reading by configuring at least one element of the reading device using the offload resonance information stored for each selected resonator.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.