Management of test artifacts using cascading snapshot mechanism
US9471453B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 5, 2013 |
| Grant date | Oct 18, 2016 |
| Priority date | — |
| Expiry date | Dec 18, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F9/451
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Described are an apparatus and method for managing test artifacts. A test plan is selected for a product having a plurality of test artifacts comprising one selected from a group consisting of an execution record and a product requirement. One of the test artifacts is selected for a snapshot at a current time. The snapshot includes a storage record that includes information associated with the selected test artifact and its relationship with other test artifacts at the current time. The snapshot of the selected test artifact is acquired. A current state of the selected test artifact is stored as an element of the snapshot. A current state of relationships of the selected test artifact to the other test artifacts is stored. A current state of the other test artifacts having a relationship with the selected test artifact is stored. A type of snapshot is determined, comprising cascading through artifacts of the test plan to capture all information and relationships associated with the test artifact, its child artifacts, and the group consisting of the execution record and the product requirement.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.