Semiconductor device and its quality management method
US9472306B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 11, 2015 |
| Grant date | Oct 18, 2016 |
| Priority date | — |
| Expiry date | Mar 11, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C29/76
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A semiconductor device capable of easily and properly detecting a defective element unit(s) and a quality management method for the semiconductor device are suggested. A semiconducting device simulating interactions between nodes in an interaction model is equipped with a quality management unit for managing the quality of each element unit provided corresponding to each node, wherein the quality management unit executes a specified quality test of each element unit, compares test results of the quality test with pre-given results to be obtained from the quality test, and detects a defective memory cell(s) and a defective element unit(s) based on the comparison results.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.