Probe tip heating assembly

US9476816B2 · kind B2 · utility

Assignee

• Hysitron, Inc. · US

Inventors

• Roger William Schmitz · Hutchinson, US
• Yunje Oh · Medina, US

Key dates

• Filing date: Nov 14, 2012
• Grant date: Oct 25, 2016
• Expiry date: Nov 14, 2032

Classification

• Technology area (CPC G): Physics
• CPC primary: G01N2203/0282
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A heating assembly configured for use in mechanical testing at a scale of microns or less. The heating assembly includes a probe tip assembly configured for coupling with a transducer of the mechanical testing system. The probe tip assembly includes a probe tip heater system having a heating element, a probe tip coupled with the probe tip heater system, and a heater socket assembly. The heater socket assembly, in one example, includes a yoke and a heater interface that form a socket within the heater socket assembly. The probe tip heater system, coupled with the probe tip, is slidably received and clamped within the socket.