Method and device for identifying a material by the spectral analysis of electromagnetic radiation passing through said material
US9476923B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 29, 2012 |
| Grant date | Oct 25, 2016 |
| Priority date | — |
| Expiry date | Nov 28, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2218/08
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method identifying a material, includes: measuring an electromagnetic radiation spectrum emitted through the material; determining at least one measurement energy band, and spectral coefficients of a comparison function in the measurement band, using the measured spectrum; estimating, using the determined spectral coefficients, a nature and/or thickness of the material based on a set of reference spectral parameters relating to reference materials and/or thicknesses and defined in reference bands. The estimating includes: prior selecting plural reference materials and/or thicknesses, as possible candidates, from comparing the spectral coefficients determined with at least one portion of the reference spectral parameters; estimating the nature and/or thickness of the material from comparing the spectral coefficients determined with the spectral parameters of at least one portion of the possible candidates, in at least one energy band common to the reference bands of the at least one portion of possible candidates and the measurement band.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.