Hierarchical determination of metrics for component-based parameterized SoCs
US9477799B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 26, 2014 |
| Grant date | Oct 25, 2016 |
| Priority date | — |
| Expiry date | Nov 26, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2111/20
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method of determining a metric of a System-on-Chip (SoC), the method comprising: receiving a model dependency graph representing the SoC, the model dependency graph having a plurality of nodes representing components of the SoC and their models, and a plurality of directed edges between the nodes representing variables passed between the nodes of the model dependency graph; modifying the model dependency graph by clustering a plurality of strongly connected nodes in the model dependency graph into a single clustered node to form a clustered model dependency graph; determining an execution schedule according to a direction of an edge in the clustered model dependency graph; and executing models in the clustered model dependency graph according to the execution schedule to determine metrics of the SoC.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.