Data storage component testing system
US9478250B1 · kind B1 · utility
1Cited by
18References
19Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Apr 24, 2015 |
| Grant date | Oct 25, 2016 |
| Priority date | — |
| Expiry date | Apr 24, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11B33/12
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A testing system that is capable of testing individual data storage components may have testing, loader, and exchange assemblies with the testing assembly having a plurality of test slots each having long and short axes. The loader assembly can be configured to transport and install a test deck or data storage device from the exchange assembly to a test slot of the plurality of test slots with a long axis of the test deck continuously aligned with the long axis of the test slot while being transported.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.