High resolution time-of-flight mass spectrometer
US9478404B2 · kind B2 · utility
1Cited by
2References
7Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 4, 2012 |
| Grant date | Oct 25, 2016 |
| Priority date | — |
| Expiry date | Dec 4, 2032 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/401
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
Mass spectrometers and related methods of making and using the same are disclosed herein that generally involve positioning a blocking or masking element in the path of an ion beam passing through the mass spectrometer so as to selectively block at least a portion of the ions in the ion beam from entering an accelerator. Mass spectrometers and related methods are also disclosed in which an ion beam passing through the mass spectrometer is deflected or otherwise aimed so as to approach a TOF axis of an accelerator at a non-zero angle.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.