Method and device for measuring the flatness of a metal product
US9488473B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Apr 3, 2013 |
| Grant date | Nov 8, 2016 |
| Priority date | — |
| Expiry date | Jun 27, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/06113
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method measures the flatness of a metal product and an associated device. The method applies to a metal product, in the form of either a strip or a plate from a metallurgical processing line. The product to be measured being, by default, free of external traction. The method contains the following steps: a) illuminating a portion of a face of the product under uniform intensity; b) capturing an image of a light line of the illuminated portion; c) relatively moving the illuminated portion and the light line in a defined direction in relation to the product; d) repeating steps a), b), c); and e) collecting the images of lines in a two-dimensional distribution of intensities and selecting a strand direction of the product in which, if at least one wave of intensities is detected, a local amplitude variation of the wave delivers a local strand flatness defect value.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.