Correcting soft reliability measures of storage values read from memory cells
US9489257B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 28, 2014 |
| Grant date | Nov 8, 2016 |
| Priority date | — |
| Expiry date | Dec 20, 2034 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03M13/6325
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for data storage includes reading storage values, which represent stored data, from a group of memory cells using read thresholds, and deriving respective soft reliability metrics for the storage values. The storage values are classified into two or more subgroups based on a predefined classification criterion. Independently within each subgroup, a subgroup-specific distribution of the storage values in the subgroup is estimated, and the soft reliability metrics of the storage values in the subgroup are corrected based on the subgroup-specific distribution. The stored data is decoded using the corrected soft reliability metrics.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.