Method of inspecting pixel array substrate and apparatus for inspecting pixel array substrate
US9489876B2 · kind B2 · utility
1Cited by
1References
19Claims
0Family size
Assignee
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Key dates
| Filing date | Feb 12, 2014 |
| Grant date | Nov 8, 2016 |
| Priority date | — |
| Expiry date | Mar 24, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG09G2360/145
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
An inspection method including following steps is provided. A pixel array substrate including a plurality of pixel units is in contact with a photoelectric inspection device. A plurality of electrical signals is inputted to the pixel units of the pixel array substrate and the photoelectric inspection device. Based on an optical property of the photoelectric inspection device, the pixel units of the pixel array substrate are being examined on whether they are normal or not. Moreover, an inspection apparatus realizing the inspection method is also provided.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.