Parameter control method for integrated circuit and integrated circuit using the same
US9490816B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 18, 2015 |
| Grant date | Nov 8, 2016 |
| Priority date | — |
| Expiry date | May 18, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R27/02
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A parameter control method for an integrated circuit and an integrated circuit using the same are provided. The method includes the steps of: providing a correspondence between 1st to Nth impedance groups and 1st to Nth first settings, wherein each impedance group includes K sub impedances; providing a correspondence between 1st to Kth sub-impedance and 1st to Kth second settings; detecting an impedance from a specific pin of the integrated circuit; comparing an impedance detected from the specific pin of the integrated circuit with the 1st to Nth impedance sets to find a corresponding specific impedance set to select a specific first setting; comparing the impedance detected from the specific pin of the integrated circuit with the 1st to Kth sub-impedance of the specific impedance set to select a specific second setting; and operating the integrated circuit according to the specific first setting and the specific second setting.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.