Method and system for implementing correlated multi-sampling with improved analog-to-digital converter linearity
US9491390B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Nov 26, 2014 |
| Grant date | Nov 8, 2016 |
| Priority date | — |
| Expiry date | May 14, 2035 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N25/78
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A method of implementing Correlated Multi-Sampling (CMS) in an image sensor with improved analog-to-digital converter (ADC) linearity starts with an ADC circuitry included in a readout circuitry that generates a plurality of uncorrelated random numbers used as a plurality of ADC pedestals for sampling image data. A Successive Approximation Register (SAR) included in the ADC circuitry stores a different one of the ADC pedestals before each sampling of the image data. The ADC circuitry samples an image data from a row a plurality of times against plurality of ADC pedestals to obtain a plurality of sampled input data. The ADC circuitry converts each of the plurality of sampled input data from analog to digital, which includes performing a binary search using the SAR. Other embodiments are also described.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.