Patent · US Active

Measurement tool for server rack

US9494406B1 · kind B1 · utility

2Cited by
8References
1Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 11, 2016
Grant dateNov 15, 2016
Priority date
Expiry dateMar 11, 2036

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01B5/02
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A structure for measuring server rack dimensions. The structure may include; a center spacer having a slider opening; a top panel fixed to a top surface of the center spacer; a bottom panel fixed to a bottom surface of the center spacer; and a slider in the slider opening of the center spacer, wherein a portion of the slider is between the top panel and the bottom panel, and the slider is horizontally movable between a starting position and an extended position, the starting position is where the slider is closest to the center of the center spacer and the extended position is where the slider is farthest from the center of the center spacer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.