Patent · US Active

Multiscale spectral nanoscopy

US9494518B2 · kind B2 · utility

1Cited by
3References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 18, 2013
Grant dateNov 15, 2016
Priority date
Expiry dateJul 18, 2033

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N15/1433
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A system and method for non-invasively tracking a particle in a sample is disclosed. The system includes a 2-photon or confocal laser scanning microscope (LSM) and a particle-holding device coupled to a stage with X-Y and Z position control. The system also includes a tracking module having a tracking excitation laser, X-Y and Z radiation-gathering components configured to detect deviations of the particle in an X-Y and Z directions. The system also includes a processor coupled to the X-Y and Z radiation gathering components, generate control signals configured to drive the stage X-Y and Z position controls to track the movement of the particle. The system may also include a synchronization module configured to generate LSM pixels stamped with stage position and a processing module configured to generate a 3D image showing the 3D trajectory of a particle using the LSM pixels stamped with stage position.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.