Multiscale spectral nanoscopy
US9494518B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 18, 2013 |
| Grant date | Nov 15, 2016 |
| Priority date | — |
| Expiry date | Jul 18, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N15/1433
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system and method for non-invasively tracking a particle in a sample is disclosed. The system includes a 2-photon or confocal laser scanning microscope (LSM) and a particle-holding device coupled to a stage with X-Y and Z position control. The system also includes a tracking module having a tracking excitation laser, X-Y and Z radiation-gathering components configured to detect deviations of the particle in an X-Y and Z directions. The system also includes a processor coupled to the X-Y and Z radiation gathering components, generate control signals configured to drive the stage X-Y and Z position controls to track the movement of the particle. The system may also include a synchronization module configured to generate LSM pixels stamped with stage position and a processing module configured to generate a 3D image showing the 3D trajectory of a particle using the LSM pixels stamped with stage position.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.