System and method for side-by-side inspection of a device
US9494532B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 22, 2011 |
| Grant date | Nov 15, 2016 |
| Priority date | — |
| Expiry date | Jan 10, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30164
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Systems and methods for inspecting a device include arranging the device in a known position relative to a plurality of movable cameras mounted on a controllable actuator controlled by a computing device and pointed at the device by controlling the controllable actuator to position a camera with a user interface on the computing device with a display, and the display displays a virtual image from the camera into CAD model of the device and an image of the device generated by the camera in a side-by-side or in an overlay fashion or both.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.