Apparatus and method for measuring quality of holographic image
US9500470B2 · kind B2 · utility
5Cited by
1References
18Claims
0Family size
Assignee
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Key dates
| Filing date | May 5, 2015 |
| Grant date | Nov 22, 2016 |
| Priority date | — |
| Expiry date | May 5, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG03H2223/19
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
An apparatus and a method for measuring quality of a holographic image are disclosed. The apparatus for measuring the quality of the holographic image may include an obtaining unit to obtain a hologram, a reconstruction unit to reconstruct a three-dimensional (3D) holographic image by irradiating the hologram with a light source, a measuring unit to measure depth of the reconstructed holographic image, and an analysis unit to analyze depth representation quality of the holographic image base on the measured depth of the holographic image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.