Method and apparatus for inspecting an object employing machine vision
US9500475B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Jan 8, 2015 |
| Grant date | Nov 22, 2016 |
| Priority date | — |
| Expiry date | Jan 8, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/2513
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A machine vision system including a digital camera can be employed to inspect an object in a field of view. This includes projecting digitally-generated light patterns including first and second boundary patterns and first and second spatial patterns onto the object in the field of view. Images associated with the projected light patterns including the object are captured. Spatial cells are found in the field of view by matching codes in the first and second spatial patterns to boundaries determined based upon one of the first and second boundary patterns. The spatial cells are found in the field of view by matching codes in the spatial patterns to boundaries determined based upon the boundary patterns. The spatial cells are decoded and matched to the boundaries. Three-dimensional (3D) point cloud data of the object is generated based upon the decoded spatial cells matched to the boundaries.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.