High-throughput and high resolution method for measuring the color uniformity of a light spot
US9500526B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Mar 13, 2013 |
| Grant date | Nov 22, 2016 |
| Priority date | — |
| Expiry date | Feb 22, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J2003/466
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The color uniformity of a light spot is measured by providing an image of the light spot by means of a camera or camera sensor with sensor elements, each of the sensor elements capturing a set of three or more color component values that together define a set of pixel values at such sensor element, wherein the image includes a plurality of sets of pixel values. The method also derives for each of the plurality of sets of pixel values at a corresponding sensor element a first ratio between a first pair of the pixel values or of values obtained therefrom in such set. Preferably a second ratio is also derived between a second pair of the pixel values or of values obtained therefrom in such set, where the second pair is different from the first pair. Where the sensor elements used each provides a single intensity value instead of multiple pixel values of different colors, light is projected onto a spot of the camera or camera sensor along an optical path with a different one of three or more different color filters sequentially in the path. For each sensor element a first ratio is derived between a first pair of the intensity values of different colors provided by such sensor element o…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.