Patent · US Active

Wavefront sensing apparatus, method and applications

US9500531B2 · kind B2 · utility

0Cited by
7References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 25, 2014
Grant dateNov 22, 2016
Priority date
Expiry dateApr 17, 2034

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01J2009/0261
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A wavefront sensing technique using Polarization Rotation INTerferometry (PRINT) provides a self-referencing, high-resolution, direct measurement of the spatially dependent phase profile of a given optical beam. A self-referencing technique is used to create a reference beam in the orthogonal polarization and a polarization measurement to measure the spatial-dependent polarization parameters to directly determine the absolute phase profile of the beam under test. A high-resolution direct measurement of the spatially-resolved phase profile of one or more optical beams is realized.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.