System and method using OAM spectroscopy leveraging fractional orbital angular momentum as signature to detect materials
US9500586B2 · kind B2 · utility
5Cited by
22References
30Claims
0Family size
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Key dates
| Filing date | Sep 1, 2015 |
| Grant date | Nov 22, 2016 |
| Priority date | — |
| Expiry date | Sep 1, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R33/3692
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus that detects a material within a sample includes signal generation circuitry that generates a first signal having at least one orbital angular momentum applied thereto and applies the first signal to the sample. A detector receives the first signal after the first signal passes through the sample and detects the material responsive to a detection of a predetermined profile of orbital angular momentum states within the first signal received from the sample.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.