Microcrystal structure analysis device, microcrystal structure analysis method, and X-ray shield device
US9500603B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 6, 2013 |
| Grant date | Nov 22, 2016 |
| Priority date | — |
| Expiry date | Jul 11, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/3306
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A microcrystal structure analysis apparatus includes: a magnetic field generation unit; a sample drive unit configured to rotate a sample container containing a sample having microcrystals suspended therein relative to the magnetic field generation unit such that a temporally varying magnetic field is applied to the sample container to three-dimensionally orient the microcrystals; an X-ray source configured to apply X rays to the sample container that is being rotated by the sample drive unit; an X-ray detection unit capable of detecting the X rays that have passed through and have been diffracted by the sample container; and a state switching device configured to cause a state where detection of the X rays by the X-ray detection unit is disenabled or a state where detection of the X rays by the X-ray detection unit is enabled, in accordance with a rotational position of a specific part which is a part of the sample container in a rotation direction thereof.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.