High and low temperature test equipment
US9500698B2 · kind B2 · utility
Assignees
Inventor
Key dates
| Filing date | Nov 29, 2013 |
| Grant date | Nov 22, 2016 |
| Priority date | — |
| Expiry date | Feb 4, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG09G2320/041
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
The invention relates to the technical field of LCD fabrication and specifically to a high and low temperature test equipment. The high and low temperature test equipment comprises a housing, and further comprises a partition disposed in the interior of the housing. The partition divides the interior of the housing into a plurality of chambers and is provided with a Peltier effect sheet. The Peltier effect sheet is used for, when it is powered-on, cooling at least one of the chambers and meanwhile heating at least one chamber other than the at least one of the chambers. The high and low temperature test equipment may cool and heat at the same time in an efficient, power conserving way and have uniform heating function.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.