Mother substrate with switch disconnecting test part, array test method thereof and display substrate
US9501959B2 · kind B2 · utility
4Cited by
4References
17Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 1, 2014 |
| Grant date | Nov 22, 2016 |
| Priority date | — |
| Expiry date | Sep 19, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG09G2330/12
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A mother substrate includes a display substrate cell defined by a scribe line, the display substrate cell including a plurality of gate lines, a gate circuit part driving the gate lines, and a gate pad part connected to the gate circuit part, a gate test pad part in a peripheral area surrounding the display substrate cell, the gate test pad part being configured to receive a gate test signal, a gate test line part connecting the gate test pad part and the gate pad part, and a switching part connected to the gate test line part and configured to control turning on and turning off of the gate test line part.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.