Systems and methods related to near-field electromagnetic scanners
US9506968B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 7, 2013 |
| Grant date | Nov 29, 2016 |
| Priority date | — |
| Expiry date | Dec 4, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R27/04
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Disclosed are systems, devices and methods related to scanners that are utilized for multiple electrical and/or magnetic field measurements at different locations of a radio-frequency (RF) module. In some embodiments, a scanning system can includes a miniature probe such as a magnetic probe, a fixture system configured to hold a device under test (DUT) such as an RF module, an operating system configured to operate the DUT, and a measurement system configured to obtain field strength measurements through the miniature probe at different locations of the DUT. Such measurements can yield a near-field distribution over a plurality of selected areas of the DUT, with each of the selected areas being smaller than an overall lateral area of the DUT. In some implementations, such a scanning system is utilized to facilitate applications such as electromagnetic (EM) shielding designs.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.