Thin film transistor substrate, method of inspecting the same, and display device including the same
US9508274B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 16, 2013 |
| Grant date | Nov 29, 2016 |
| Priority date | — |
| Expiry date | May 12, 2034 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D86/60
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A thin film transistor substrate, includes: pixels disposed in a display area of the thin film transistor substrate and connected to gate lines and data lines; gate pad parts connected to first ends of the gate lines; first test transistors each being connected to a second end of a corresponding gate line of the gate lines; data pad parts connected to first ends of the data lines; and second test transistors each being connected to a second end of a corresponding data line of the data lines. The gate pad parts, the data pad parts, the first test transistors, and the second test transistors are disposed in a non-display area of the thin film transistor substrate. The first test transistors are configured to be switched to receive a first inspection signal and the second test transistors are configured to be switched to receive a second inspection signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.