Patent · US Active

MEMS device calibration

US9513184B2 · kind B2 · utility

2Cited by
3References
23Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 11, 2014
Grant dateDec 6, 2016
Priority date
Expiry dateOct 10, 2034

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01L19/04
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

One example discloses a MEMS device, including: a cavity having an internal environment; a seal isolating the internal environment from an external environment outside the MEMS device; wherein the seal is susceptible to damage in response to a calibration unsealing energy; wherein upon damage to the seal, a pathway forms which couples the internal environment to the external environment; and a calibration circuit capable of measuring the internal environment before and after damage to the seal.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.