Method for inspecting electronic device and electronic device inspection apparatus
US9513313B2 · kind B2 · utility
0Cited by
0References
8Claims
0Family size
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Key dates
| Filing date | May 23, 2012 |
| Grant date | Dec 6, 2016 |
| Priority date | — |
| Expiry date | Jul 18, 2033 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02E10/542
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for inspecting an electronic device, in which inspection of electrical characteristics is carried out, uses conduction to pass a current to an electronic device while the electronic device is being continuously conveyed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.