Systems and methods for eliminating measurement artifacts of external quantum efficiency of multi-junction solar cells
US9513328B2 · kind B2 · utility
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18Claims
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Key dates
| Filing date | Mar 12, 2013 |
| Grant date | Dec 6, 2016 |
| Priority date | — |
| Expiry date | Jun 28, 2034 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02E10/50
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A pulsed voltage bias method and/or pulsed light bias method may be used to reduce, minimize, and/or eliminate external quantum efficiency measurement artifacts of multi-junction solar cells, for example artifacts caused by the shunt effect. In this manner, multi-junction solar cells may be designed and constructed with improved performance, efficiency, and the like.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.