Measuring latency in a test system using captured images
US9514664B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 25, 2012 |
| Grant date | Dec 6, 2016 |
| Priority date | — |
| Expiry date | Mar 24, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG09G2380/12
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A latency measurement system includes an event generation device that generates an initial event used to measure system latency. A component test system receives the event and in response outputs a test component output signal and a zero-latency indicator. An electronics system including a multifunction display unit receives the test component output signal and displays a visible element on the multifunction display unit. A camera generates a series of recorded images, where each recorded image contains an image of the zero-latency indicator and an image of the visible element. A processor then determines the system latency by determining a time difference in the series of recorded images between a representation of an occurrence of the event in the image of the zero-latency indicator and a representation of the occurrence of the event in the image of the visible element.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.