Data storage component test deck system
US9514781B2 · kind B2 · utility
2Cited by
9References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Apr 24, 2015 |
| Grant date | Dec 6, 2016 |
| Priority date | — |
| Expiry date | Apr 24, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11B19/048
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A system may utilize at least an enclosed test deck that has an access port door covering an access port. The system can test a data storage component by presenting the enclosed test deck to an exchange assembly before exposing an interior test region of the test deck by engaging the access port door with a tool of the exchange assembly. At least one data storage component may be installed into the interior test region and subsequently the access port is closed by installing the access port door into the access port.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.