Infrared detector with metal-black coating having dielectric overlayer and related methods
US9518868B2 · kind B2 · utility
3Cited by
11References
16Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Jun 19, 2014 |
| Grant date | Dec 13, 2016 |
| Priority date | — |
| Expiry date | Jul 11, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J5/046
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An infrared (IR) detector may include a substrate, circuitry carried by the substrate, and a metal-black layer over the thermometric element. The circuitry may include a thermometric element with a measurable thermometric property. The IR detector may include a dielectric layer covering the metal-black layer, and the circuitry provides a value for IR radiation absorbed by the metal-black layer.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.