Method and device for temperature-based data refresh in non-volatile memories
US9520200B2 · kind B2 · utility
4Cited by
11References
21Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 6, 2015 |
| Grant date | Dec 13, 2016 |
| Priority date | — |
| Expiry date | Nov 6, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C16/349
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The invention relates to a method comprising measuring the temperature of at least one location of a non-volatile memory; determining if said temperature measurement indicates that the data retention time of data stored at said at least one location is reduced below a threshold; and re-writing said data to said non-volatile memory in a response to a positive determination.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.