Measurements of multiple external components through a single pin of an integrated circuit

US9521712B1 · kind B1 · utility

Assignee

• CIRRUS LOGIC, INC. · US

Inventors

• John L. Melanson · Austin, US
• Arnab Kumar Dutta · Austin, US
• Stephen T. Hodapp · Austin, US
• Prashanth Drakshapalli · Austin, US

Key dates

• Filing date: Jul 29, 2014
• Grant date: Dec 13, 2016
• Expiry date: Feb 3, 2035

Classification

• Technology area (CPC H): Electricity
• CPC primary: H05B45/00
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

Multiple measurements may be obtained via a single pin of an integrated circuit (IC) to set multiple control parameters of a light emitting diode (LED) controller within the IC. For example, a first input signal may be applied from the IC to two or more components via a single IC pin. A first output signal may be obtained from the two or more components via the single IC pin. A second input signal may be applied from the IC to the two or more components via the single IC pin, and a second output signal may be obtained from the two or more components via the single IC pin. A first parameter and a second parameter of the two or more components may be calculated based, at least in part, on the first output signal and the second output signal obtained via the single IC pin.