Method for measuring the waveform capture rate of parallel digital storage oscilloscope
US9523717B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 18, 2013 |
| Grant date | Dec 20, 2016 |
| Priority date | — |
| Expiry date | Jan 14, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R13/0254
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention provides a method for measuring the waveform capture rate of parallel digital storage oscilloscope. On the basis of double pulse measurement, and in consideration of the asymmetry of acquisition and the refreshing time of parallel DSO, the present invention provides a step amplitude-frequency combined pulse measurement to measure the time for waveform acquisition and mapping Tmap, the number of captured waveforms before LCD refreshing Wacq and the dead time caused by LCD refreshing TDDT, and then calculates the measured average WCR of parallel DSO, according to the measured data, so that the WCR of parallel can be measured.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.