Patent · US Active

Method for determining an overall loss of capacitance of a secondary cell

US9523741B2 · kind B2 · utility

1Cited by

3References

15Claims

0Family size

Assignee

Siemens Aktiengesellschaft · DE

Inventors

Dieter Most · Bruchköbel, DE
Wolfgang Weydanz · Buckenhof, DE
Holger Wolfschmidt · Erlangen, DE

Key dates

Filing date	May 8, 2013
Grant date	Dec 20, 2016
Priority date	—
Expiry date	Sep 14, 2033

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/367
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method for determining an overall loss of capacitance of a secondary cell, for example of an accumulator, which is brought about by ageing processes is provided. The overall loss of capacitance is determined additively from partial losses of capacitance which are determined by means of various parameters from various functions. A partial loss of capacitance is determined under constant peripheral conditions. If the peripheral conditions change, the partial losses of capacitance follow one another directly, i.e. with respect to the same loss of capacitance. The interval of the respective charge throughput rate is shifted here. The overall loss of capacitance of a secondary cell can be extended to the overall loss of capacitance of a package composed of a plurality of secondary cells.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.