Patent · US Active

Measurement device and measurement method for measuring the thickness of a panel-shaped object

US9528811B2 · kind B2 · utility

2Cited by

12References

8Claims

0Family size

Assignee

TRUMPF Maschinen Austria GmbH & Co. KG · AT

Inventors

Michael Auzinger · Linz, AT
Thomas Denkmeier · Traun, AT
Alfred Haselboeck · Eisenlohrsweg, AT

Key dates

Filing date	Nov 6, 2013
Grant date	Dec 27, 2016
Priority date	—
Expiry date	Feb 11, 2034

Classification

Technology area (CPC G)Physics
CPC primaryG01B2210/44
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A measurement device (100 . . . 103) for measuring the thickness (d) of a plate-shaped object (7) is indicated, which comprises a first measurement sensor (21 . . . 23) for being set onto a first surface (9) of the plate-shaped object (7) and a second to fourth measurement sensor (31 . . . 53) for being set onto a second surface (10), opposite to the first surface (9) of the plate-shaped object (7). Furthermore, the measurement device (100 . . . 103) comprises means for calculating the thickness (d) of the plate-shaped object (7), using the positions (81 . . . 84) at which the measurement sensors (21 . . . 53) touch the plate-shaped object (7). Furthermore, a measurement method for measuring the thickness (d) of a plate-shaped object (7) is also indicated.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.