X-ray monitoring optical elements
US9529098B2 · kind B2 · utility
1Cited by
9References
13Claims
0Family size
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Key dates
| Filing date | Sep 30, 2013 |
| Grant date | Dec 27, 2016 |
| Priority date | — |
| Expiry date | Jan 20, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01T1/26
- WIPO fieldEnvironmental technology
- WIPO sectorChemistry
Abstract
An X-ray article and method for analyzing hard X-rays which have interacted with a test system. The X-ray article is operative to diffract or otherwise process X-rays from an input X-ray beam which have interacted with the test system and at the same time provide an electrical circuit adapted to collect photoelectrons emitted from an X-ray optical element of the X-ray article to analyze features of the test system.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.