Methods and apparatus for determining slowness of wavefronts
US9529109B2 · kind B2 · utility
5Cited by
9References
19Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 4, 2012 |
| Grant date | Dec 27, 2016 |
| Priority date | — |
| Expiry date | Jan 2, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01V2210/6222
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Methods and apparatus for determining slowness of wavefronts. An example apparatus includes one or more sources spaced from a receiver. The one or more sources are to transmit one or more signals and the receiver is to receive at least a portion of the one or more signals. The apparatus includes a processor to process waveform data associated with the one or more signals by stacking waveforms of the waveform data based on to linear moveout and sinusoidal moveout.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.