Driving circuit having built-in-self-test function
US9530338B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 16, 2014 |
| Grant date | Dec 27, 2016 |
| Priority date | — |
| Expiry date | Dec 20, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG09G3/36
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A driving circuit includes at least one reference voltage source, at least one offset unit, and at least one buffer module. The at least one reference voltage source generates a reference voltage. The at least one offset unit generates an offset voltage, wherein the offset voltage and the reference voltage form a judging voltage range. The at least one buffer module has a first input end, a second input end, and an output end, wherein the first input end receives an analog voltage; the at least one reference voltage source is connected with the second input end; the at least one buffer module, according as whether the analog voltage is within the judging voltage range, outputs a pass logic signal or a fail logic signal at the output end. Particularly, the buffer module has Built-In-Self-Test (BIST) function and can increase test efficiency and voltage accuracy.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.