Patent · US Active

Method of forming through wiring

US9530692B2 · kind B2 · utility

0Cited by
0References
26Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 9, 2015
Grant dateDec 27, 2016
Priority date
Expiry dateFeb 9, 2035

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB06B1/0292
  • WIPO fieldChemical engineering
  • WIPO sectorChemistry

Abstract

Provided is a method of forming a through wiring, including forming a first insulating film on a first surface and a second surface of a substrate; forming a through hole to pass through the first insulating film formed on the first surface side and the substrate; forming a second insulating film formed from a material different from that of the first insulating film on an inner wall of the through hole; forming a conductive film on the first insulating film formed on the second surface; forming an opening in the first insulating film by processing the first insulating film formed on the second surface; and filling an inner portion of the through hole with a conductive material by electrolytic plating using the conductive film exposed at the bottom portion of the through hole as a seed layer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.