Scatter correction method and apparatus for computed tomography imaging
US9538975B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Apr 8, 2015 |
| Grant date | Jan 10, 2017 |
| Priority date | — |
| Expiry date | Jul 13, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/10081
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
A method and apparatus to correct for scatter in projection data by successive approximations of a primary-beam estimate and a scatter estimate. The scatter estimate is calculated by convolving a scattering function, which is a function of the primary-beam estimate, with a smoothing function that includes Rayleigh scattering and Compton scattering terms. The scattering function is greater than zero in the limit that the primary-beam estimate goes to zero. The projection data can be X-ray computed tomography projection data, and the choice of scattering function has the benefit of reducing dark-band artefacts in reconstructed computed tomography images.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.