Device for localizing hot spots with heat flow meters
US9541455B2 · kind B2 · utility
1Cited by
9References
13Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 27, 2012 |
| Grant date | Jan 10, 2017 |
| Priority date | — |
| Expiry date | Mar 6, 2033 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L2924/0002
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The electronic device comprises a substrate provided with a surface comprising a region of interest, the thermal behavior of which is to be monitored, and a system for detecting hot spots located in the region of interest. The system for detecting hot spots comprises at least three separate heat flow meters arranged on the surface of the substrate outside of the region of interest.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.