Particle sampling and measurement in the ambient air
US9541488B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 19, 2013 |
| Grant date | Jan 10, 2017 |
| Priority date | — |
| Expiry date | Sep 19, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N15/0606
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus and method for sampling and measuring air born particulate matter includes an inlet for the particulate containing gas to enter. A mechanism then removes coarse particles larger than a selected size while permitting filtered particles of less than the selected size to pass through. A chamber containing a quartz crystal sensor permits the filtered particles that have passed through to deposit to create an output signal in response to the deposited particle mass.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.