Automated postflight troubleshooting sensor array
US9541505B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 5, 2010 |
| Grant date | Jan 10, 2017 |
| Priority date | — |
| Expiry date | Feb 23, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2291/26
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The advantageous embodiments provide an apparatus for identifying anomalies on an object comprising a sensor system and an analysis process. The sensor system is configured to detect a presence of the object, identify a speed of travel for the object, and determine a scan rate for the object using the speed of travel to generate scan results. The analysis process is configured to analyze the scan results and determine whether a number of maintenance anomalies are detected on the object using the scan results.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.